Engineering of the resistive switching properties in V2O5 thin film by atomic structural transition: Experiment and theory

Published in Journal of Applied Physics, 2018

Recommended citation: Zhenni Wan, Hashem Mohammad, Yunqi Zhao, Cong Yu, Robert Darling, MP Anantram, "Engineering of the resistive switching properties in V2O5 thin film by atomic structural transition: Experiment and theory." Journal of Applied Physics, 2018.