Engineering of the resistive switching properties in V2O5 thin film by atomic structural transition: Experiment and theory
Published in Journal of Applied Physics, 2018
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Recommended citation: Zhenni Wan, Hashem Mohammad, Yunqi Zhao, Cong Yu, Robert Darling, MP Anantram, "Engineering of the resistive switching properties in V2O5 thin film by atomic structural transition: Experiment and theory." Journal of Applied Physics, 2018.